Scanning Systems

RFID Essentials (Theory in Practice (O'Reilly))

Radio Frequency Identification (RFID) is rapidly changing the way businesses track inventory and assets. From Wal-Mart and Tesco to the U.S. Department of Defense, early efforts are already showing benefits, but software, integration, and data processing for RFID still present a challenge. If you are a developer or an architect charged with developing an RFID system, this book is for you. Drawing on extensive experience, Bill Glover and Himanshu Bhatt provide you with essential information on this emerging technology.

With the knowledge you gain in these pages, you will possess the information and understanding you need to start designing, building, or integrating with RFID systems.

In RFID Essentials you will find information on:

• Tags and tag protocols, including the Electronic Product Code (EPC)
• Readers and reader protocols
• RFID middleware
• Security and privacy
• Managing RFID devices
• RFID's impact on your architecture

Bill Glover has been writing software since 1981 and has worked as a programmer, lead developer, or architect on systems of all sizes, from small, automated systems controlling dams and feedmills up to a complete redesign and reimplementation of one of the world's busiest travel web sites. Bill first worked with RFID in 1995, tracking individual cattle using ear tags. He is currently a Senior Java Architect with Sun Microsystems, Inc., and works with Sun's RFID consulting practice and the RFID Test Center.

Himanshu Bhatt heads the U.S. RFID Practice and Software Technology Lab for Sun Microsystems, Inc. Prior to assuming this role, Himanshu was responsible for business development and consulting in emerging areas of technology. Himanshu has over 16 years of experience in the architecture and development of distributed, multitier systems using a host of technologies for Fortune 1000 companies. Himanshu has spoken at industry conferences such as JavaOne and the LoneStar Symposium and has published articles on Java/J2EE technologies.

"The Information Age is over. We're entering an era where network connectivity is almost ubiquitous - it's participate or perish." --Jonathan Schwartz, President and COO, Sun Microsystems, Inc.

"Unique competitive advantage erupts from enterprises that couple the RFID technologies laid out in RFID Essentials with modern business integration using service-oriented architectures. This is the book to read in order to understand this new landscape." --Mark Bauhaus, Senior Vice President, Sun Microsystems, Inc.

"This is a must read for RFID Software and Solution architects and is highly recommended for anyone needing to gain more insight into the myriad of components, standards and technologies that make up an RFID solutions environment." --Bryan Tracey, Chief Architect, GlobeRanger Corporation

"The authors have done a commendable job of covering a lot of ground in the RFID space, including the infrastructure needed to share the volumes of data RFID will likely generate." --Graham Gillen, Senior Product Manager, VeriSign

Healthy Crops: A New Agricultural Revolution

Atom Probe Tomography: Analysis at the Atomic Level

Written by the inventor of the technique, this book provides the first complete description of atom probe tomography (APT). This microanalytical technique enables the distribution of all the elements present in a material to be experimentally determined. The instrument known as a three-dimensional atom probe (3DAP) is able to determine the spatial coordinates and the elemental identities of the individual atoms in a metal with atomic resolution. The compositions of small volumes are determined by simply counting the number of atoms of each type within that volume, and thus the technique provides a fundamental measure of the local concentration.
The book provides a brief history of the development of the APT technique and the different types of three-dimensional atom probes that have been developed. The various methods of fabricating the needle-shaped specimens and the procedures used to obtain high resolution images of the specimen with field ion microscopy and to conduct a three-dimensional atom probe analysis are described in detail. Special attention is given to the selection of the experimental parameters required to provide accurate analyses. The methods of visualizing and analyzing the three-dimensional data are described.
The technique has been used to characterize the microstructures of a wide spectrum of metals ranging from simple model systems to complex commercial alloys. A comprehensive list of papers relating to the metallurgical applications of atom probe tomography is included.

Design of Multi-frequency CW Radars

This book deals with the basic theory for design and analysis of Low Probability of Intercept (LPI) radar systems. The design of one such multi-frequency high resolution LPI radar, PANDORA, is covered. This work represents the first time that the topic of multi-frequency radars is discussed in such detail and it is based on research conducted by the author in The Netherlands. The book provides the design tools needed for development, design, and analysis of high resolution radar systems for commercial as well as military applications. Software written in MATLAB and C++ is provided to guide the reader in calculating radar parameters and in ambiguity function analysis. Some radar simulation software is also included. CONTENTS:
Part I: Fundamentals of CW Radar
1. Frequency Modulated Continuous Wave (FMCW) Radar
2. Radar Waveforms and Processing
3. The Radar Ambiguity Function
4. FMCW Waveform
5. Phase-Coded Waveform
6. Frequency Hopped Waveform
Part II: Theory and Design of Calypso FMCW Radar
7. Design Approach Part III: Theory and Design of Pandora Multifrequency Radar
8. Design Approach
9. Implementation of the Single Channel Pandora and Other Issues
10. PANDORA Multi-channel Radar
Appendices
A CW Radar Range Equations
B The Design Process
C A Hardware Solution to the Range Resolution Problem
D Non-Linearity in FM Waveforms
E Transmitter Noise Leakage
F Pandora Receiver Channel-Basic Design
G Direct Digital Synthesis
H Implementation of the Single Channel Radar
I Pandora Radar Performance Verification Measurements
J 8 Way Combiner Analysis Results
K MATLAB Simulation Program
L Level Diagram Calculations -- SFCW Radar
List of Symbols
Index
Description of Software

Ocr With a Smile!: An Operator's Guide to Optical Character Recognition

This book is about Optical Character Recognition (OCR) Systems; how to operate them for maximum throughput and achieve the highest possible accuracy in the process. With this comprehensive reference you will get a clear idea of what must be done and how to start doing it when no software manual addresses your specific problem.

Handbook of Optical and Laser Scanning (Optical Engineering)

The Handbook of Optical and Laser Scanning reveals the fundamentals of controlling light beam deflection, factors in image fidelity and quality, and the newest technological developments currently impacting scanner system design and applications. This highly practical reference features a logical chapter organization, authoritative yet accessible writing, and hundreds of supporting illustrations. Contributions from 27 subject specialists from the United States, Europe, and Asia afford a valuable range of perspectives as well as global coverage of optical and laser beam scanning. With more than 550 works cited, this Handbook is essential for optical engineers, technologists, scientists, and undergraduate and graduate students in these disciplines. About the Editor: GERALD F. MARSHALL is a Consultant in Optical Design and Engineering, Niles, Michigan. Specializing in optical scanning and display systems, his extensive experience includes senior positions with Kaiser Electronics, San Jose, California; Energy Conversion Devices, Troy, Michigan; Axsys Technologies (formerly Speedring Systems), Rochester Hills, Michigan; and Medical Lasers, Burlington, Massachusetts. Previously he was engaged as a Senior R&D Engineer for airborne navigational display systems at Ferranti Ltd., Edinburgh, Scotland, and as a Physicist with Morganite International Ltd., London, England. The author of many papers, he holds a number of patents and is the editor of two internationally recognized reference books, Laser Beam Scanning and Optical Scanning (both titles, Marcel Dekker, Inc.). He is a Fellow of The Institute of Physics, the Optical Society of America, and SPIE-The International Society for Optical Engineering, of which he is a former director. He received the B.Sc. degree from LondonUniversity, England.

Micromachined Mirrors (Microsystems)

Presents descriptions of mirrors made from two fabrication processes in the surface micromachining process.

Unified Optical Scanning Technology

Written by an award-winning leader in the field, this is a thoroughly integrated overview of the many facets and disciplines of optical scanning. Of particular utility to both practitioner and student are such features as:

• An overview of the technology and unifying principles, including active and passive scanning, optical transfer, and system architecture
• In-depth chapters on scanning theory and processes, scanned resolution, scanner devices and techniques, and the control of scanner beam misplacemen
• A comprehensive review of the government-sponsored research of agile beam steering, now primed for commercial adaptation
• A unique focus on the Lagrange invariant and its revealing resolution invariant

2003 Oclc Environmental Scan: Pattern Recognition.

Scanning Technology & Process Optimization: Advances in the Wood Industry

This book gives mill managers practical guidance on the selection of scanning and process optimization systems for primary and secondary wood processing.

Electronic scanning is one of the most rapidly changing technologies in the wood industry, largely due to advances made in data processing. Optimization of any wood processing operation requires machine vision technology that can accurately determine log geometry and external and internal log features considered as defects, as well as computer technology that provides a solution at production speed. This essential reference analyzes the latest scanning methods and describes in detail how they can be used to maximize log processing efficiency and value recovery.

Topics covered include: enterprise optimization; optimizing log bucking and sorting; three dimensional log scanning for automation of log breakdown; lumber scanning for optimized edging, ripping, and cross-cutting; and automated defect detection for lumber grading.